IEC 60679-5:1998 pdf download - Quartz crystal controlled oscillatorsof assessed quality - Part 5: Sectional specification -Qualification approval

IEC 60679-5:1998 pdf download – Quartz crystal controlled oscillatorsof assessed quality – Part 5: Sectional specification -Qualification approval

Posted by

IEC 60679-5:1998 pdf download – Quartz crystal controlled oscillatorsof assessed quality – Part 5: Sectional specification -Qualification approval.
This sectional specification applies to quartz crystal controlled oscillators whose quality is assessed on the basis of capability approval.
H prescribes the preferred ratings and characteristics. wiIt’i appropriate lests and measuring methods contained in the generic specification IEC 60679-1, and gives the general performance requirements to be used in detail specifications for quartz crystal controlled oscillators.
1.2 Normative references
The following normative documents contain provisions which, through reference in this text, constitute provisions of this part of lEG 60679. At the time of publication, Ihe editions indicated were valid. All normative documents are subject to revision, and parties to agreements based on this part of IEC 60679 are encouraged to investigate the possibility of applying the most recent editions of the normative documents indicated below. Members of IEC and ISO maintain registers of currently valid International Standards.
IEC 60679-1:1997, Quartz crystal controlled osc,llators of assessed quality — Part 1: Generic spocilica lion
IEC 60679-5.1:1998. Quartz crystal controlled oscillators of assessed quality — Part 5.1: Blank detail specification — Qualification approval
IEC OC 001002:1986, Rules of Procedure of the lEG Quality Assessment System for Electronic Components (IECO)
2 Preferred ratings and guidance on detail specifications
2.1 Preferred values for ratings and characteristics
The values given in detail specifications shall preferably be selected from those stated in 2.3 of lEG 60679•l.
2.2 InformatIon to be prescribed In detail specifications
Guidance on the preparation of detail specifications shall be derived from the future blank detail specification, IEC 60679-5-1.
Each detail specification shall stale all the tests and measurements required for inspection. This shall, as a minimum, Include the relevant tests given In the blank detail specification, with methods and seventies.
The following information shall be given in each detail specification.
2.2.1 Outline drawing and dimensions
The detail specification shall include a dimensional drawing of the crystal controlled oscillator andor the reference to an appropriate International standard to permit easy recognition and to provide information for dimensioning and gauging procedures.
The dimensions shall include the overall dimensions of the body of the component and the size and spacing of the terminations. All dimensions shall be stated In millimetres.
Terminal connections shall be identified for all enclosures
This information may be given in more detail in an annex.
2.2.2 MountIng of the component
The detail specification shall define any assembly restrictions on the use of the crystal controlled oscillator. Where these restrictions apply special mounting fixtures may be required for the bump, shock, vibration and acceleration tests. Such fixtures shall be described In the detail specification.
Where no special mounting fixtures are indicated, then the above tests shall be carried out as specified In clause 4 of IEC 60679-1.
2.2.3 Severlties for environmental tests
The detail specification shall state the method of testing and the appropriate seventies selected from clause 4 of IEC 60679-1
2.2.4 MarkIng
The detail specification shall state the required marking on the crystal controlled oscillator and on the primary package in accordance with 2.4 of IEC 60679-1.
2.2.5 OrderIng Information
The detail specification shalt prescribe that the following information is required when ordering a crystal controlled oscillator:
a) quantity:
b) detail specification number, issue number and date: and where applicable:
c) nominal Irequency expressed in kilohertz (kKz) or megahertz (MHz);
d) enclosure type:
a) frequency tolerance(s) and operating temperature range:
f) full description of any additional requirement.
2.2.6 AdditIonal Information (not for Inspection purposes)
The detail specification may include information which is not normally required to be verified by the inspection procedure. such as circuit diagrams. curves, drawings and notes needed for clarification.

Leave a Reply

Your email address will not be published. Required fields are marked *