IEC 60747-12-3:1998 pdf download – Semiconductor devices -Part 12-3: Optoelectronic devices – Biank detail specification for light-emitting diodes -Display application

IEC 60747-12-3:1998 pdf download – Semiconductor devices -Part 12-3: Optoelectronic devices – Biank detail specification for light-emitting diodes -Display application.
The lEG quality assessment system for electronic components is operated in accordance with the statutes of the IEC and under the authority of the IEC. The object of this system is to define quality assessment procedures in such a manner that electronic components released by one participating country as conforming with the requirements of an applicable specification are equally acceptable in all other participating countries without the need for further testing.
This blank detail specification is one of a series of blank detail specifications for semiconductor devices and should be used with the following IEC publications:
IEC 60747-blOC 700000:1991, Semiconductor devices — Part 10: Generic specification for discrete devices and integrated circuits
IEC 60747-1 2/QC 720100:1991, Semiconductor devices — Part 12: Sectional specification for optoelectronic devices
Required information
Numbers shown in brackets on this and the following page correspond to the following items of required information, which should be entered in the spaces provided.
Identification of the detail specification
[1] The name of the national standards organization under whose authority the detail specification is issued.
[2] The IECQ number of the detail specification.
[3] The numbers and issue numbers of the generic and sectional specifications.
[4] The national number of the detail specification, data of issue and any further information, if required by the national system.
Identification of the component
[5] Main function and type number.
[6] Information on typical construction (materials, the main technology) and the package. If a device has several kinds of derivative products, those differences shall be indicated, for example feature of characteristics in the comparison table.
If a device is sensitive to electrostatic charges, a caution statement shall be added in the detail specification.
[7] Outline drawing, terminal identification, marking and/or reference to the relevant document for outlines.
[8] Category of assessed quality according to 2.6 of the generic specification.
[9] Reference data.
6 MarkIng
(Any particular information other than given in box [7] (clause 1) and/or subclause 2.5 of
IEC 60747-10, shall be given here.]
7 Ordering information
The following minimum information is necessary to order a specific device, unless otherwise
specified:
— precise type reference (and nominal voltage value, it required);
— IECQ reference of detail specification with issue number and/or date when relevant;
— category of assessed quality as defined in 3.7 of the sectional specification and, if required. screening sequence. as defined in 3.6 of the sectional specification;
— any other particulars.
8 Test conditions and inspection requirements
(These are given in the following tables, where the values and exact test conditions to be used shall be specified as required for a given type, and as required by the relevant test in the relevant IEC publication.]
(When several devices are included in the same detail specification, the relevant conditions and/or values should be given on successive lines, where possible avoiding repetition of identical conditions and/or values.]
[The choice between alternative tests or test methods shall be made when a detail specifications is written.]
Throughout the following text, reference to subclause numbers are made with respect to the generic specification, unless otherwise stated, and test methods are quoted from clause 4 of the sectional specification.
(For sampling requirements, either refer to, or reference, values of 3.7 of the sectional specification, according to applicable category(ies) of assessed quality.]
[For group A, the choice between AOL and LTPD system shall be made in the detail specification.]