IEC 60748-21:1997 pdf download – Semiconductor devices-Integrated circuits – Part 21: Sectional specification for film integrated circuitsand hybrid film integrated circuits on the basisof the qualification approval procedures

IEC 60748-21:1997 pdf download – Semiconductor devices-Integrated circuits – Part 21: Sectional specification for film integrated circuitsand hybrid film integrated circuits on the basisof the qualification approval procedures.
This sectional specification applies to film integrated Circuits and hytNid film integrated circuits. manufactured as catalogue circuits or as custom-built circuits whose quality is assessed on the basis of qualification approval.
The object of this specification Is to present preferred values for ratings and characteristics, to select from the generic specification the appropriate tests and measuring methods and to give general performance requirements to be used in detail specifications for film integrated circuits and hybrid film integrated Circuits derived from this specification.
The concept of preferred values is directly applicable to catalogue circuits but does not necessarily apply to custom-built circuits.
Test seventies and requirements prescribed in detail specifications referring to this sectional specification are of equal or higher performance level, because lower performance levels are not permitted.
Associated with this specification are one or more blank detail specifications, each referenced by an lEG number. A blank detail specification which has been completed as specified In 2.3 of this specification forms a detail specification. Such detail specifications are used for the granting of qualification approval of film integrated circuits and hybrid film integrated circuits and quality conformance inspection in accordance with the IECO system.
NOTE — For lest procedures two alternatives aro available: method A o method B. However, Iii not perrmlted to chan. th, methods between lest; of method A. r.;peciiv.ly 8 In g.nwal. method A is more suitabt• br passive-component based film integrated circuits, whereas method B is mere applicable to semiconductor integrated clicud technology based film integrated circu.ta.
2 General, preferred characteristics, ratings and seventies for environmental tests
2.1 Normatrve references
The following normative documents contain provisions which, through reference in this text. constitute provisions of this part of IEC 60748. At the time of publication, the editions indicated were valid. All normative documents are subject to revision, and parties to agreements based on this part of IEC 60748 are encouraged to investigate the possibility of applying the most recent editions of the normative documents indicated below. Members of IEC and ISO maintain registers of curiently valid International Standards.
lEG 60063: 1963, Preferred number series for resistors and capacitors
IEC 60748-20: 1988, Semiconductor devices — integrated circuits — Part 20.’ Generic specification for film integrated circuits and hybrid film integrated circuits
IEC 60748-20-1: 1994, Semiconductor devices — Integrated circuits — Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits — Section 1:
Requirements for internal visual examination
2.2 Prelerred ratings and characteristics
Preferred values of voltages and currents are given in IEC 60747-1; for resistors and capacitors, preferred values are given in IEC 60063: for custom•bullt circuits, any values and tolerances may be chosen.
2.3 Information to be given in a detail specification
Detail specifications shall be derived from the relevant blank detail specifications.
Detail specifications shall not specify seventies inferior to those of the generic or sectional specification. When more severe requirements are Included, they shall be listed in the detail specification and indicated In the test schedules, for examp4e by an asterisk.
NOTE — The intorinateon given on dimensions, cliaractenatics and ratings may, to, convenience, be presenied In labular 1a.m.
The following Information shall be given In each detail specification and the values quoted shall preferably be selected from those given in the appropriate clause of this sectional specification.
Each detail specification shall prescribe all the tests and measurements required for lot-by-lot inspection and periodic testing. This shall, as a minimum, include the relevant tests given in this specification with methods and seventies.
2.3.1 Outline drawing and dimensions
There shall be an illustration of the circuit as an aid to easy recognilion and for comparison of the circuit with others. Dimensions and their associated tolerances, which affect interchangeability and mounting, shall be prescribed in the detail specifications. All dimensions shall be stated in millimetres.
Normally, numerical values shall be given for length. width and height of the body. and the termination spacing or, for cylindrical types, the body diameter and length and diameter of the terminations
When necessary, for example when in a detail specification more than one package is Covered, the dimensions and their associated tolerances shall be placed in a table below the drawing.